Yayınlar & Patentler
İFALAB
Bilimsel Çıktılar & Fikri Mülkiyet

Yayınlar & Patentler
İFALAB Akademik Portföyü

Yayınlar
 
 
2026 On the Thermal Transient Behaviors of a-IGZO TFTs: Roles of Oxygen Flow Rate During Sputtering and Post-Deposition Air Annealing
Materials Science in Semiconductor Processing Q1 SCI-Expanded Ağustos 2026
2026 Design and Prototype Fabrication of a Cost-Effective Substrate Cleaner for Lab-Scale Semiconductor Processes
Balkan 15th International Conference on Applied Sciences Tebliğ / Bildiri Mart 2026
2025 Enhancing Hole Mobility in p-Type Thin Film Transistors: The Impact of Annealing in Air on Intrinsic and p‑µc‑Si:H Films Deposited at 100 °C
Journal of Materials Science: Materials in Electronics Q2 SCI-Expanded Mayıs 2025
2024 Enhancing Hole Mobility in p-Type Thin Film Transistors: The Impact of Annealing in Air on Low-Temperature Deposited Intrinsic and p‑µc‑Si:H Films
The 30th International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS30) Tebliğ / Bildiri Ağustos 2024
2022 Hydrogen Diluted Growth of a-SiNx:H Film and Its Effect on Cr- and Al-Gated nc-Si:H TFTs
29th International Conference on Amorphous & Nanocrystalline Semiconductors (ICANS-29) Tebliğ / Bildiri Ağustos 2022
2021 Comparison of Chromium- and Aluminum-Gated Nanocrystalline Silicon TFTs
IEEE Transactions on Electron Devices Q1 SCI-Expanded Ekim 2021
2020 SEM, EDX Spectroscopy and Real-Time Optical Microscopy of Electroformed Silicon Nitride-Based Light Emitting Memory Device
European Physical Journal – Applied Physics SCI-Expanded Nisan 2020
2020 Transmission Electron Microscope Imaging of Plasma Grown Electroformed Silicon Nitride-Based Light Emitting Diode for Direct Examination of Nanocrystallization
European Physical Journal – Applied Physics SCI-Expanded Şubat 2020
2019 Electroformed Silicon Nitride-Based Light Emitting Memory Device Investigated by SEM, EDX and Real-Time Optical Microscopy Analyses
28th International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 28) Tebliğ / Bildiri Ağustos 2019
2019 Transmission Electron Microscope Analysis of PECVD Grown Electroformed Silicon Nitride-Based Light Emitting Diode
28th International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 28) Tebliğ / Bildiri Ağustos 2019
2018 Dual-Mechanism Modelling of Instability in Nanocrystalline Silicon Thin Film Transistors Under Prolonged Gate-Bias Stress
Thin Solid Films Q2 SCI-Expanded Nisan 2018
2017 Frequency-Dependent Error of Forward Bias Capacitance Spectroscopy in the Density of States Calculation of Semiconductor Diodes
International Conference on Science, Technology, Engineering and Management (ICSTEM) Tebliğ / Bildiri Aralık 2017
2017 Temporary Sub-Band Transport Level in Nanocrystalline Silicon Nitride Light Emitting Memory Device
27th International Conference on Amorphous and NanocrystallineSemiconductors (ICANS 27) Tebliğ / Bildiri Ağustos 2017
2017 Two-Stage Instability Mechanism in Nanocrystalline Silicon TFTs Under Prolonged Gate-Bias Stress
27th International Conference on Amorphous and NanocrystallineSemiconductors (ICANS 27) Tebliğ / Bildiri Ağustos 2017
2017 Electroformed Silicon Nitride-Based Light Emitting Memory Device
Applied Physics Letters Q1 SCI-Expanded Temmuz 2017
2016 Comparison of Negative Capacitance Phenomenon in Ordinary Amorphous and Electroformed Nanocrystalline Silicon-Based LEDs
Applied Nanotechnology and Nanoscience International Conference 2016 Tebliğ / Bildiri Kasım 2016
2016 Memory Effect in Electroformed Nanocrystal Silicon Nitride-Based Thin Film LED
Applied Nanotechnology and Nanoscience International Conference Tebliğ / Bildiri Kasım 2016
2016 Estimation of Glucose Concentration in Solution Using Near Infrared Spectroscopy and Artificial Neural Network
24th IEEE Signal Processing and Communication Application Conference (SIU) Tebliğ / Bildiri Mayıs 2016
Patentler
 
 
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Akademik Şeffaflık

Yayın listeleri, atıf bilgileri ve patent kayıtları Karabük Üniversitesi UNİS sistemi üzerinden anlık olarak güncellenmektedir. En güncel ve eksiksiz bilgiye ulaşmak için araştırmacılarımızın kurumsal profil sayfalarını ziyaret edebilirsiniz.